| Academic Year |
2025Year |
School/Graduate School |
Graduate School of Advanced Science and Engineering (Master's Course) Division of Advanced Science and Engineering Earth and Planetary Systems Science Program |
| Lecture Code |
WSC08000 |
Subject Classification |
Specialized Education |
| Subject Name |
地球惑星物質分析法 |
Subject Name
（Katakana） |
チキュウワクセイブッシツブンセキホウ |
Subject Name in
English |
Analytical Techniques for Earth and Planetary Materials Science |
| Instructor |
OHKAWA MAKIO,SHIBATA TOMOYUKI,YABUTA HIKARU,ANDO JUN-ICHI,DAS KAUSHIK |
Instructor
(Katakana) |
オオカワ マキオ,シバタ トモユキ,ヤブタ ヒカル,アンドウ ジュンイチ,ダス カウシク |
| Campus |
Higashi-Hiroshima |
Semester/Term |
1st-Year, First Semester, 1Term |
| Days, Periods, and Classrooms |
(1T) Thur5-8：AdSM 402N |
| Lesson Style |
Lecture |
Lesson Style
(More Details) |
Face-to-face |
| Lecture and practical training |
| Credits |
2.0 |
Class Hours/Week |
4 |
Language of Instruction |
B
:
Japanese／English |
| Course Level |
5
:
Graduate Basic
|
| Course Area（Area） |
25
:
Science and Technology |
| Course Area（Discipline） |
04
:
Earth and Planetary Science |
| Eligible Students |
Graduate students of Department of Earth and Planetary Systems Science, Faculty of Science |
| Keywords |
X-ray analyses, Mass spectrography, Scanning-type electron microscopy |
| Special Subject for Teacher Education |
|
Special Subject |
|
Class Status
within Educational
Program
(Applicable only to targeted subjects for undergraduate students) | |
|---|
Criterion referenced
Evaluation
(Applicable only to targeted subjects for undergraduate students) | |
|---|
Class Objectives
/Class Outline |
Elements of X-ray analyses, mass spectrography, and scanning-type electron microscopy |
| Class Schedule |
1-3: Principles of X-ray (Ohkawa)
4-6: X-ray diffraction (Ohkawa)
7-8: X-Ray spectrochemical analysis (Das)
9-10: Microscopy Methods Using Electron Beams (Ando)
11-12: Isotopic analysis and chronology (Shibata)
13-14: Molecular characterization of organic compounds (Yabuta)
15: Summary
Short test and/or report will be required |
Text/Reference
Books,etc. |
Modern Powder Diffraction, Reviews in Mineralogy (Mineralogical Society of America)
"Applications of Inorganic Mass Spectrometery" by J.R. De Laeter (ISBN 0-471-34539-3) |
PC or AV used in
Class,etc. |
|
| (More Details) |
PC-Projecter |
| Learning techniques to be incorporated |
|
Suggestions on
Preparation and
Review |
Review what was learned |
| Requirements |
|
| Grading Method |
Number of attendances and scores of short tests and/or submitted reports |
| Practical Experience |
|
| Summary of Practical Experience and Class Contents based on it |
|
| Message |
|
| Other |
|
Please fill in the class improvement questionnaire which is carried out on all classes.
Instructors will reflect on your feedback and utilize the information for improving their teaching. |